Engineering topics
Publications and source records attributed to Pellish, Jonathan Allen.
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
We report low-energy proton and alpha particle SEE data on a 32 nm silicon-on-insulator (SOI) complementary metal oxide semiconductor (CMOS) static random access memory (SRAM) that demonstrates the criticality of understanding and using low-energy protons for SEE testing of highly-scaled technologies
While standards and guidelines for performing SEE testing have existed for several decades, guidance for developing SEE test plans has not been as easy to find. In this presentation, the variety of areas that need to be considered ranging from resource issues (funds, personnel, schedule) to extremely technical challenges (particle interaction and circuit application), shall be discussed. Note: we consider the approach outlined here as a "living" document: Mission-specific constraints and new technology related issues always need to be taken into account.
Radiation Hardness Assurance (RHA) is the process of ensuring space system performance in the presence of a space radiation environment. Herein, we present an updated NASA methodology for RHA focusing on content, deliverables and timeframes.