Search NASA⌕ Search

NASA NTRS · 20140005695

Single Event Effects (SEE) Testing: Practical Approach to Test Plans

Abstract

While standards and guidelines for performing SEE testing have existed for several decades, guidance for developing SEE test plans has not been as easy to find. In this presentation, the variety of areas that need to be considered ranging from resource issues (funds, personnel, schedule) to extremely technical challenges (particle interaction and circuit application), shall be discussed. Note: we consider the approach outlined here as a "living" document: Mission-specific constraints and new technology related issues always need to be taken into account.

Explore related subjects

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

LaBel, Kenneth A., Pellish, Jonathan Allen, Berg, Melanie D.. 2014-03-31. Single Event Effects (SEE) Testing: Practical Approach to Test Plans. https://ntrs.nasa.gov/citations/20140005695

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related reports

NASA Goddard Space Flight Center’s Compendium of Radiation Effects Test Results

Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoelectronics, digital, analog, and bipolar devices.

Single Event Effects (SEE)↗