Engineering topics

Peters, Palmer N.

Publications and source records attributed to Peters, Palmer N..

At least 19 records

NASA NTRS2000

Solid-Liquid Interface Characterization Hardware

The objective is to develop enabling technology to characterize the solid-liquid interface during directional solidification to unprecedented levels with real-time measurement hardware. Existing x-ray imaging hardware is combined with compact Seebeck furnaces and thermal profiling hardware, under development, to accomplish the measurements. Furnace thermal profiles are continuously measured in addition to the sample characteristics.

Peters, Palmer N.↗

NASA NTRS2000

Solid-Liquid Interface Characterization Hardware: Advanced Technology Development (ATD)

This ATD has the goal of enabling the integration of three separate measurement techniques to characterize the solid-liquid interface of directionally solidified materials in real-time. Arrays of film-based metal thermocouple elements are under development along with compact Seebeck furnaces suitable for interfacing with separately developed X-ray Transmission Microscopes. Results of applying film arrays to furnace profiling are shown, demonstrating their ability to identify a previously undetected hardware flaw in the development of a second-generation compact furnace. Results of real-time furnace profiling also confirmed that the compact furnace design effectively isolates the temperature profiles in two halves of the furnace, a necessary feature. This isolation had only been inferred previously from the characteristics of Seebeck data reported. Results from a 24-thermocouple array successfully monitoring heating and isothermal cooling of a tin sample are shown. The importance of non-intrusion by the arrays, as well as furnace design, on the profiling of temperature gradients is illustrated with example measurements. Further developments underway for effectively combining all three measurements are assessed in terms of improved x-ray transmission, increased magnification, integral arrays with minimum intrusion, integral scales for velocity measurements and other features being incorporated into the third generation Seebeck furnace under construction.

Peters, Palmer N.↗

NASA NTRS1995

Measurements of the optical properties of thin films of silver and silver oxide

The optical properties of silver films and their oxides are measured to better characterize such films for use as sensors for atomic oxygen. Good agreement between properties of measured pure silver films and reported optical constants is observed. Similar comparisons for silver oxide have not been possible because of a lack of reported constants, but self-consistencies and discrepancies in our measured results are described.

Peters, Palmer N.↗

NASA NTRS1995

Changes in chemical and optical properties of thin film metal mirrors on LDEF

Thin films of the metals Cu, Ni, Pt, Au, Sn, Mo, and W deposited on fused silica flats were exposed at ambient temperature on the leading and trailing faces of the LDEF. Reflectances of these films were measured from 250 to 2500 nm and compared with controls. The exposed films were subjected to the LDEF external environment including atomic oxygen, molecular contamination, and solar ultraviolet. Major changes in optical and infrared reflectance were seen for Cu, Mo, Ni, and W films on the leading face of LDEF and are attributed to partial conversion of metal to metal oxide. Smaller changes in optical properties are seen on all films and are probably caused by thin contaminant films deposited on top of the metal. The optical measurements are correlated with film thickness measurements, x-ray photoelectron spectroscopy, optical calculations, and, in the case of Cu, with x-ray diffraction measurements. In a few cases, comparisons with results from a similar UAH experiment on STS-8 have been drawn.

Peters, Palmer N.↗

NASA NTRS1994

Multilayer thin film Hall effect device

A Hall effect device and a method of obtaining a magnetic field map of a magnetic body with the Hall effect device are presented. The device comprises: (1) a substrate, (2) a first layer having a first Hall coefficient deposited over the substrate, and (3) a second layer having a second Hall coefficient deposited over the first layer, the first and second layers cooperating to create, in the Hall effect device, a third Hall coefficient different from the first and second Hall coefficients. Creation of the third Hall coefficient by cooperation of the first and second layers allows use of materials for the first and second layers that were previously unavailable for Hall effect devices due to their relatively weak Hall coefficient.

Peters, Palmer N.↗

NASA NTRS1994

Metal-Film Hall-Effect Devices

Large positive and negative Hall coefficients achievable. Family of Hall-effect devices made from multilayer metal films instead of semiconductor materials. Metal films easier to fabricate; formed by deposition on variety of substrates, and leads readily attached to them. Fabricated with larger areas, potentially more reliable, and less affected by impurities. Also used to measure magnetic fields. Devices especially useful at low temperatures.

Peters, Palmer N.↗

NASA NTRS1993

The interaction of atomic oxygen with copper: An XPS, AES, XRD, optical transmission, and stylus profilometry study

The University of Alabama in Huntsville (UAH) experiment A-0114 was designed to study the reaction of material surfaces with low earth orbits (LEO) atmospheric oxygen. The experiment contained 128 one-inch circular samples; metals, polymers, carbons, and semiconductors. Half of these samples were exposed on the front of the Long Duration Exposure Facility (LDEF) and remaining on the rear. Among metal samples, copper has shown some interesting new results. There were two forms of copper samples: a thin film sputter-coated on fused silica and a solid piece of OFHC copper. They were characterized by x-ray and Auger electron spectroscopies, x-ray diffraction, and high resolution profilometry. Cu 2p core level spectra were used to demonstrate the presence of Cu2O and CuO and to determine the oxidation states.

Raikar, Ganesh N.↗

NASA NTRS1993

Refinements on the pinhole camera measurements of the LDEF attitude

The results from the University of Alabama in Huntsville (UAH) pinhole camera were reanalyzed to include the effects of corotation of the atmosphere with the Earth as well as satellite oscillation. Previous results from the instrument showed that the satellite had stable attitude offsets in yaw of 8.0 deg and 1.0 deg in pitch; these offsets are unchanged by the present analysis. The primary impact zone of oxygen, i.e., the directly exposed spot on a silver detector, had a ratio of major to minor axes equal to 1.05, which was interpreted as being caused by a small oscillation of plus or minus 0.35 degrees (with precision plus or minus 0.15 degrees). The present analysis shows that the observed effect can largely be accounted for by atmospheric corotation, but that an additional oscillation in yaw of the order of a degree cannot be excluded. The sensitivity of the pinhole camera to satellite oscillations is shown to decrease nonlinearly with decreasing magnitude of the oscillation and to vary inversely with the gas temperature.

Peters, Palmer N.↗

NASA NTRS1992

Thermal control surfaces on the MSFC LDEF experiments

There were five Marshall Space Flight Center (MSFC) experiments on the LDEF. Each of those experiments carried thermal control surfaces either as test samples or as operational surfaces. These materials experienced varying degrees of mechanical and optical damage. Some materials were virtually unchanged by the extended exposure while others suffered extensive degradation. The synergistic effects due to the constituents of the space environment are evident in the diversity of these material changes. The sample complement for the MSFC experiments is described along with results of the continuing analyses efforts.

Wilkes, Donald R.↗

NASA NTRS1992

Fluorescence of thermal control coatings on S0069 and A0114

Many of the thermal control surfaces exposed to the space environment during the 5.8 year LDEF mission experienced changes in fluorescence. All of the thermal control coatings flown on LDEF experiments S0069 and A0114 were characterized for fluorescence under ambient conditions. Some of the black coatings, having protective overcoats, appear bright yellow under ultraviolet exposure. Urethane based coatings exhibited emission spectra shifts toward longer wavelengths in the visible range. Zinc oxide pigment based coatings experienced a quenching of fluorescence, while zinc orthotitanate pigment based and other ceramic type coatings had no measurable fluorescence.

Zwiener, James M.↗

NASA NTRS1992

Flouorescence measurements of the thermal control coatings on LDEF experiments S0069 and A0114

Strong fluorescence emissions were observed, during post flight ultraviolet light inspection of experiments S0069 and A0114, from some of the surfaces exposed to the space environment. Subsequent wavelength measurements of the fluorescence emission characteristics, indicated large changes occurred between controls and exposed materials. Black urethane based coatings, especially ones having a silicone atomic oxygen protective overcoat, appear bright yellow under ultraviolet exposure. Measurements showed that the urethane based coatings had their emission spectra shifted into the visible wavelength range. In contrast, zinc oxide pigment type coatings showed a different effect, which was a quenching or reduction of their fluorescence versus exposure time. Silver Teflon bonded to aluminum with acrylic adhesive also showed a slight measurable fluorescence, which was found to originate in the acrylic adhesive.

Zwiener, James M.↗

NASA NTRS1992

Angular distributions of 5eV atomic oxygen scattered from solid surfaces on the LDEF satellite

The angular distribution of 5eV atomic oxygen scattered off several smooth solid surfaces was measured by experiment A0114 which flew on board the Long Duration Exposure Facility (LDEF). Target surfaces were silver, vitreous carbon, and lithium fluoride crystal. The apparatus was entirely passive. It used the property of silver surfaces to absorb oxygen atoms with high efficiency; the silver is converted to optically transmissive silver oxide. A collimated beam of oxygen atoms is allowed to fall on the target surface at some pre-set angle. Reflected atoms are then intercepted by a silver film placed so that it subtends a considerable solid angle from the primary beam impact on the target surface. The silver films are evaporated onto flexible optically-clear polycarbonate sheets which are scanned later to determine oxygen uptake. While the silver detector cannot measure atom velocity or energy, its physical configuration allows easy coverage of large angular space both in the beam-plane (that which includes the incident beam and the surface normal), and in the azimuthal plane of the target surface.

Gregory, John C.↗

NASA NTRS1992

Interaction of atomic oxygen with thin film and bulk copper: An XPS, AES, XRD, and profilometer study

The University of Alabama in Huntsville (UAH) experiment A-0114 was designed primarily to study degradation of material surfaces due to low earth orbital (LEO) atmospheric oxygen. The experiment contained 128 one inch circular samples: metals, polymers, carbons, and semiconductors. Among metal samples, copper has shown some interesting new results. Two types of copper samples, a film sputter coated on fused silica and a bulk piece of OFHC copper, were characterized employing a variety of techniques such as X-ray and Auger electron spectroscopies, X-ray diffraction, and high resolution profilometry. Cu 2p core level spectra were used to characterize the presence of Cu2O and CuO in addition to Cu Auger LMM lines. These results are supported by our recent X-ray diffraction studies which clearly establish the presence of Cu oxides which we were unable to prove in our earlier work. Profilometry showed an increase in thickness of the film sample where exposed to 106.7 +/- 0.5 nm from an initial thickness of 74.2 +/- 1.1 nm. Further studies with SEM and ellipsometry are underway.

Raikar, Genesh N.↗

NASA NTRS1992

Pinhole cameras as sensors for atomic oxygen in orbit: Application to attitude determination of the LDEF

Images produced by pinhole cameras using film sensitive to atomic oxygen provide information on the ratio of spacecraft orbital velocity to the most probable thermal speed of oxygen atoms, provided the spacecraft orientation is maintained stable relative to the orbital direction. Alternatively, information on the spacecraft attitude relative to the orbital velocity can be obtained, provided that corrections are properly made for thermal spreading and a corotating atmosphere. The Long Duration Exposure Facility (LDEF) orientation, uncorrected for a corotating atmosphere, was determined to be yawed 8.0 +/- 0.4 degrees from its nominal attitude, with an estimated +/- 0.35 degree oscillation in yaw. The integrated effect of inclined orbit and corotating atmosphere produces an apparent oscillation in the observed yaw direction, suggesting that the LDEF attitude measurement will indicate even better stability when corrected for a corotating atmosphere. The measured thermal spreading is consistent with major exposure occurring during high solar activity, which occurred late during the LDEF mission.

Peters, Palmer N.↗

NASA NTRS1992

Measurements of erosion characteristics for metal and polymer surfaces using profilometry

The surfaces of many materials exposed in low earth orbit are modified due to interaction with atomic oxygen. Chemical changes and surface roughening effects can occur which alter optical and other properties. The experiment A0114 contained 128 solid surface samples, half of which were exposed on the front and half on the rear of LDEF. Each sample has been subjected to many analyses, but only the methods and techniques used to measure the changes in roughness, erosion depths, and material growth using profilometry are described.

Christl, Ligia C.↗

NASA NTRS1992

Interactions of atomic oxygen with material surfaces in low Earth orbit: Preliminary results from experiment A0114

The atomic oxygen experiment consisted of two trays (one-sixth of a Long Duration Exposure Facility (LDEF) tray each) of 64 one inch diameter solid samples. It was intended that the effects of atomic oxygen and solar ultraviolet irradiation on the surface properties of each material could be distinguished from each other and from the effects of aging. Sixteen of the samples were placed on a thermally isolated plate of highly polished aluminum, while the main plate was coated with the thermal control coating S13-GLO. Though the experiment was entirely passive, it was hoped that the effects of thermal activation might be observed, if present. The plates were expected to stabilize at temperatures differing by 20-30 C. The samples included thin films of metals Os, Ir, Pt, Ni, Mo, and Al coated onto silica optical flats, metal carbides (WC, SiC), solid carbons of various types, eight polymers, and some other coatings of various types. Analysis is essentially complete using stylus profilometry with high sensitivity Talystep and lower sensitivity Talysurf machines. Though the integrated fluence of O atoms on the LDEF was 30 times that of previous missions, etch depths of the polymers such as the polyimide Kapton show excellent agreement with extrapolations from previous flight data. However, some new effects were observed. We demonstrated on a previous experiment on STS-8 that profilometry of this kind can show steps of 50 A (for example those due to oxide film growth on metals) and this is now the preferred method for estimating etch depth (or mass loss) of erodible substances.

Gregory, John C.↗

NASA NTRS1992

Effects on LDEF exposed copper film and bulk

Two forms of copper were exposed to the Long Duration Exposure Facility (LDEF) Mission 1 environment: a copper film initially 74.2 plus or minus 1.1 nm thick sputter coated on a fused silical flat and a bulk piece of oxygen free, high conductivity (OFHC) copper. The optical density of the copper film changed from 1.33 to 0.70 where exposed and the film thickness increased to 106.7 plus or minus 0.5 nm where exposed. The exposed area appears purple by reflection and green by transmission for the thin film and maroon color for the bulk copper piece. The exposed areas increased in thickness, but only increase in the thickness of thin film samples could be readily measured. The increase in film thickness is consistent with the density changes occurring during conversion of copper to an oxide. However, we have not been able to confirm appreciable conversion to an oxide by x ray diffraction studies. We have not yet subjected the sample to e-beams or more abusive conditions out of concern that the film might be modified.

Peters, Palmer N.↗

NASA NTRS1991

Effects on LDEF exposed copper film and bulk

Two forms of copper were exposed to the Long Duration Exposure Facility (LDEF) Mission 1 environment: a copper film, initially 74.2 plus or minus 1.1 nm thick sputter coated on a fused silica flat and a bulk piece of oxygen-free, high conductivity (OFHC) copper. The optical density of the copper film changed from 1.33 to 0.70 where exposed, and the film thickness increased to 106.7 plus or minus 0.5 nm where exposed. The exposed area appears purple by reflection and green by transmission for the thin film and maroon color for the bulk copper piece. The exposed areas increased in thickness, but only increase in the thickness of the thin film sample could be readily measured. The increase in film thickness is consistent with the density changes occurring during conversion of copper to an oxide. However, we have not been able to confirm appreciable conversion to an oxide by x-ray diffraction studies. We have not yet subjected the sample to e-beams or more abusive investigations out of concern that the film might be modified.

Peters, Palmer N.↗