NASA NTRS · 20000072487
Solid-Liquid Interface Characterization Hardware
Abstract
The objective is to develop enabling technology to characterize the solid-liquid interface during directional solidification to unprecedented levels with real-time measurement hardware. Existing x-ray imaging hardware is combined with compact Seebeck furnaces and thermal profiling hardware, under development, to accomplish the measurements. Furnace thermal profiles are continuously measured in addition to the sample characteristics.
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Peters, Palmer N.. 2000-01-01. Solid-Liquid Interface Characterization Hardware. https://ntrs.nasa.gov/citations/20000072487
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