Engineering topics
Publications and source records attributed to Ray Ladbury.
This paper presents the results of reliability life testing performed on commercial electronic devices that experienced non-destructive single-event latch-up (SEL) during heavy-ion testing.
SEL is a serious obstacle to use of state-of-the-art microelectronics, and a priori prediction of SEL susceptibility has proven elusive. We develop SEL risk-assessment tools based on analysis of large archives of SEL test data for unhardened CMOS parts. Results include a flexible method for bounding SEL rates even with minimal test data.
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Following a recommendation of the NASA Engineering and Safety Center (NESC), in 2022 NEPP has initiated the development of a NASA Agency-level Technical Standard for RHA. Progress status is presented on behalf of the SME core team.
Following a recommendation of the NASA Engineering and Safety Center (NESC), in 2022 NEPP has initiated the development of a NASA Agency-level Technical Standard for RHA. An initial progress status is presented on behalf of the SME core team.
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We propose Generalized Linear Models for understanding errors in SEE rate due to uncertainties in LET of the ion responsible for the event. Applications are suggested and assessed for suitability of treatment by the model.
This study was undertaken to determine the total ionizing dose (TID) sensitivity of the PA10 Power Op Amp Manufactured by APEX (figure 1), which is a candidate for use on the LDCM TIRS instrument. The test was conducted with interest in both parametric degradation and functional failure in the configuration like that of the TIRS application. (See figure 2). The DUT was irradiated in a stepwise fashion, with parametric and functional degradation measured between steps. The parts were irradiated with gamma rays at a low dose rate (~0.01 rads(Si)/sec.).
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The purpose of these tests was to characterize the susceptibility of the LSK389 and LSK489 Dual N-Channel JFET from Linear Systems to Single-Event Latchup due to heavy ions and to Total Ionizing Dose (TID) degradation at -65 °C and intermediate dose rate. The test was carried out to assess suitability of the amplifiers for the Ocean Color instrument (OCI) on the Plankton, Aerosol, Cloud, ocean Ecosystem (PACE) spacecraft.
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Explore the source record for details and available documents.
Explore the source record for details and available documents.
Explore the source record for details and available documents.
Explore the source record for details and available documents.
We develop guidelines for a priori assessment of risk due to potentially SEL susceptible parts by exploratory analysis of large datasets of SEL test data for unhardened CMOS parts.