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NASA NTRS · 20250006971

Reliability Impacts of Non-Destructive Single-Event Latch-Ups in Commercial Electronics

Abstract

This paper presents the results of reliability life testing performed on commercial electronic devices that experienced non-destructive single-event latch-up (SEL) during heavy-ion testing.

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Stephen Martinez, Razvan Gaza, Ray Ladbury, Lyudmyla Ochs, Greg Allen, Alyson Topper, Timothy Mondy, Robert Hodson. 2025-07-14. Reliability Impacts of Non-Destructive Single-Event Latch-Ups in Commercial Electronics. https://ntrs.nasa.gov/citations/20250006971

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