NASA NTRS · 20250006971
Reliability Impacts of Non-Destructive Single-Event Latch-Ups in Commercial Electronics
Abstract
This paper presents the results of reliability life testing performed on commercial electronic devices that experienced non-destructive single-event latch-up (SEL) during heavy-ion testing.
Explore related subjects
Keep this discovery
Stephen Martinez, Razvan Gaza, Ray Ladbury, Lyudmyla Ochs, Greg Allen, Alyson Topper, Timothy Mondy, Robert Hodson. 2025-07-14. Reliability Impacts of Non-Destructive Single-Event Latch-Ups in Commercial Electronics. https://ntrs.nasa.gov/citations/20250006971
Cite the original work for its findings. Save a collection to share your selection of sources.
Discover connections
Connections use source metadata and explicit phrase matches, not verified experimental comparisons.