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Ray, K. P.

Publications and source records attributed to Ray, K. P..

Flight data from the PASP-Plus experiment

The photovoltaic array space power (PASP)-Plus solar cell flight experiment is described, and the observed performances of different solar cell types during the first six months of their operation, are summarized. The solar cell types include single crystal and amorphous silicon, GaAs, several multijunction cell types, indium phosphide and GaAs/GaSb concentrator cells. The radiation degradation experienced by some of the solar cell types agrees with theoretical predictions. Other samples, including silicon, are degraded less than predicted. Effects, including the increase in temperature of all the experiments and the effect of sun glint on cell measurement, are discussed.

Marvin, D. C.

CRRES microelectronic test chip

The JPL CRRES chip was designed and fabricated in 1985 and included in the CRRES MEP. MOSFET Matrix results show the effect of shielding on radiation-induced MOSFET threshold voltage shifts and channel mobility degradation. Shielded (middle board) MOSFETs have a threshold-voltage damage factor that is approximately three orders of magnitude smaller than would be estimated from Co-60 ground tests. Unshielded (outer board) MOSFETs have a threshold-voltage damage factor that would be estimated from Co-60 ground tests. Temperature swings as large as 23 C with a 22.5 orbit periodicity affected the MOSFET data and were removed from the data in order to reveal the radiation effects. This experiment demonstrated the feasibility of characterizing MOSFETs in a matrix, thus reducing the complexity and mass of the experiment.

Lin, Y.-S.