EdgeCortix SAKURA-I Machine-Learning, PCIe Accelerator SEE Proton Test
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Seth Roffe↗
Engineering topics
Scott Stansberry
Publications and source records attributed to Scott Stansberry.
Direct Ionization from Low-Energy Electrons in a Highly-Scaled CMOS Process
Low-energy-electron-induced single-event upsets are observed in a 22 nm fully-depleted silicon-on-insulator process at nominal and higher supply voltages. Electron dose enhancement was also observed.
low-energy electrons↗
Combined Total Ionizing Dose and Single-Event Effects on a 22 nm Fully-Depleted Silicon-on-Insulator Test Vehicle
Total ionizing dose irradiations were performed on a 22 nm fully-depleted silicon-on-insulator static random access memory. There is a strong well-bias effect in the TID response. Combined TID and SEE results are also presented.
total ionizing dose↗
Recent Radiation Test Results on a 22FDX Test Vehicle
Total ionizing dose irradiations were performed on a 22 nm fully-depleted silicon-on-insulator static random access memory. There is a strong well-bias effect in the TID response. Combined TID and SEE results are also presented.
total ionizing dose↗
Recent Radiation Test Results on a 22FDX Test Vehicle
Total ionizing dose irradiations were performed on a 22 nm fully-depleted silicon-on-insulator static random access memory. There is a strong well-bias effect in the TID response. Combined TID and SEE results are also presented.
total ionizing dose↗
Analog Devices ADXL354 Low Noise, Low Drift, Low Power, 3-Axis MEMS Accelerometer Total Ionizing Dose Characterization Test Report
The purpose of this test was to characterize the Analog Devices ADXL354 parameter degradation for total dose response. In the test, the device was exposed to a dose rate of 50 rad(Si)/s or 0.5 Gy(Si)/s using a gamma radiation source in accordance with MIL-STD-883K Paragraph 3.6.1 (Condition A). Device parameters such as supply current, self-test voltage response, and LDO regulator output voltages were monitored.
Total Ionizing Dose (TID)↗
Initial SEE Results of the Sakura-I AI/ML Accelerator
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Seth Roffe↗