NASA NTRS · 20205010699
Direct Ionization from Low-Energy Electrons in a Highly-Scaled CMOS Process
Abstract
Low-energy-electron-induced single-event upsets are observed in a 22 nm fully-depleted silicon-on-insulator process at nominal and higher supply voltages. Electron dose enhancement was also observed.
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Megan C Casey, Scott Stansberry, Matthew L Breeding, Robert A Reed, Jonathan A Pellish. 2020-12-03. Direct Ionization from Low-Energy Electrons in a Highly-Scaled CMOS Process. https://ntrs.nasa.gov/citations/20205010699
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