Engineering topics

Jonathan A Pellish

Publications and source records attributed to Jonathan A Pellish.

12 records

NASA NTRS2022

Safe Human Expeditions Beyond Low Earth Orbit (LEO)

The NASA Engineering and Safety Center (NESC) conducted an interdisciplinary study and workshop focusing on capabilities needed for crew health and safety on long-duration deep space expeditions in support of the Artemis Program and missions to Mars. The study focused on integration among four disciplines: 1) space weather monitoring and forecasting, 2) shielding technologies, 3) human health research, and 4) human factors engineering tools. An integrated risk assessment was performed to inform characteristics of mission architecture and capabilities needed for safe, long-duration human expeditions beyond low Earth orbit. This report contains the outcome of the NESC assessment.

Low Earth Orbit↗

NASA NTRS2022

Compendium of Radiation Effects Test Results from NASA Goddard Space Flight Center

Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, and bipolar devices.

Single Event Effects (SEE)↗

NASA NTRS2021

Domestic U.S. Proton Access Status – Update for >200 MeV Sites

This presentation will document the current state of high energy (>200 MeV) proton access in the U.S. for Single Event Effects (SEE) testing. This is continuation of efforts since the shutdown of the Indiana University Cyclotron Facility (IUCF).

Proton↗

NASA NTRS2021

Avionics Radiation Hardness Assurance (RHA) Guidelines

Based on the need to develop and adopt timely and up-to-date guidance to ensure that natural space radiation environment threats do not compromise mission success, the NASA Engineering and Safety Center (NESC) was solicited to develop and publish guidance for deriving radiation hardness assurance (RHA) requirements and for evaluating avionics hardware elements with respect to total ionizing dose, total non-ionizing dose, and single event effects. This document contains the outcome of the NESC assessment.

Guidelines↗

NASA NTRS2021

Compendium of Radiation Effects Test Results from NASA Goddard Space Flight Center

Single Event Effects (SEE)↗

NASA NTRS2021

Observation of Low-Energy Proton Direct Ionization in a 72-Layer 3D NAND Flash Memory

Single-event upsets are observed in a 72-layer 3D NAND flash memory operated in single-level cell mode after low-energy proton (500 keV-1.2 MeV) and heavy ion irradiation. The layer-by-layer error count is analyzed to visualize the stopping of low energy protons within the memory stack, and Monte Carlo simulations are correlated with the experimental data. Direct ionization by low-energy protons is identified by three-dimensional data analysis and the energy dependence of device sensitive cross-section. Heavy ion data is also presented for comparison.

Direct ionization↗

NASA NTRS2021

Single-Event Transient Case Study for System-Level Radiation Effects Analysis

Analog single-event transient results are analyzed for two different applications within one system architecture. Application-specific analyses are presented on the MAX4595 commercial device using single-event effects criticality and goal structuring notation.

Single-event effects↗

NASA NTRS2020

NASA Goddard Space Flight Center’s Compendium of Radiation Effects Test Results

Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoelectronics, digital, analog, and bipolar devices.

Single Event Effects (SEE)↗

NASA NTRS2020

Direct Ionization from Low-Energy Electrons in a Highly-Scaled CMOS Process

Low-energy-electron-induced single-event upsets are observed in a 22 nm fully-depleted silicon-on-insulator process at nominal and higher supply voltages. Electron dose enhancement was also observed.

low-energy electrons↗

NASA NTRS2018

NASA Goddard Space Flight Center’s Compendium of Recent Single Event Effects Results

We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.

Single Event Effects (SEE)↗

NASA NTRS2013

IEEE Nuclear and Space Radiation Effects Conference: Notes on the Early Conferences

This paper gathers the remembrances of several key contributors who participated in the earliest Institute of Electrical and Electronics Engineers (IEEE) Nuclear and Space Radiation Effects Conferences (NSREC).

Institute of Electrical and Electronics Engineers ↗

NASA NTRS2011

Total Ionizing Dose Testing of the Analog Devices’ AD648 Dual Precision Operational Amplifier

The Analog Devices (ADI) AD648 was tested for total ionizing dose response at the Goddard Space Flight Center (GSFC) Radiation Effects Facility (REF) beginning 1 June 2011. This test served as the radiation lot acceptance test (RLAT) for the lot date code (LDC) tested. Low dose rate (LDR) irradiations were performed in this test so that the device susceptibility to enhanced low dose rate sensitivity (ELDRS) could be determined.

Alvin J Boutte↗