Single-Event Transient Case Study for System-Level Radiation Effects Analysis

Michael J Campola; Rebekah Ann Austin; Edward P Wilcox; Hak S Kim; Raymond L Ladbury; Kenneth A LaBel; Jonathan A Pellish

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Single-Event Transient Case Study for System-Level Radiation Effects Analysis

Michael J Campola·Rebekah Ann Austin·Edward P Wilcox·Hak S Kim·Raymond L Ladbury·Kenneth A LaBel·Jonathan A Pellish

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Abstract

Analog single-event transient results are analyzed for two different applications within one system architecture. Application-specific analyses are presented on the MAX4595 commercial device using single-event effects criticality and goal structuring notation.

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Single-event effects single-event transients radiation system-level effects

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Michael J Campola, Rebekah Ann Austin, Edward P Wilcox, Hak S Kim, Raymond L Ladbury, Kenneth A LaBel, Jonathan A Pellish. 2021-04-01. Single-Event Transient Case Study for System-Level Radiation Effects Analysis. https://ntrs.nasa.gov/citations/20210010826

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