Search NASA⌕ Search

Engineering topics

Sisneros, Robert

Publications and source records attributed to Sisneros, Robert.

An Entropy-Based Test and Development Framework for Uncertainty Modeling in Level-Set Visualizations

We present a simple comparative framework for testing and developing uncertainty modeling in uncertain marching cubes implementations. The selection of a model to represent the probability distribution of uncertain values directly influences the memory use, run time, and accuracy of an uncertainty visualization algorithm. We use an entropy calculation directly on ensemble data to establish an expected result and then compare the entropy from various probability models, including uniform, Gaussian, histogram, and quantile models. Our results verify that models matching the distribution of the ensemble indeed match the entropy. We further show that fewer bins in nonparametric histogram models are more effective whereas large numbers of bins in quantile models approach data accuracy.

Sisneros, Robert↗

A terminology for in situ visualization and analysis systems

The term "in situ processing" has evolved over the last decade to mean both a specific strategy for visualizing and analyzing data and an umbrella term for a processing paradigm. The resulting confusion makes it difficult for visualization and analysis scientists to communicate with each other and with their stakeholders. To address this problem, a group of over 50 experts convened with the goal of standardizing terminology. This paper summarizes their findings and proposes a new terminology for describing in situ systems. An important finding from this group was that in situ systems are best described via multiple, distinct axes: integration type, proximity, access, division of execution, operation controls, and output type. This paper discusses these axes, evaluates existing systems within the axes, and explores how currently used terms relate to the axes.

97 MATHEMATICS AND COMPUTING↗

DXT: Darshan eXtended Tracing

As modern supercomputers evolve to exascale, their I/O subsystems are becoming increasingly complex, making optimization of I/O for scientific applications a daunting task. Although I/O profiling tools facilitate the process of optimizing application I/O performance, legacy profiling tools lack flexibility in their level of detail and ability to correlate traces with other sources of data. Additionally, a lack of robust trace analysis tools makes it difficult to derive actionable insights from large-scale I/O traces. Darshan is an HPC I/O characterization tool that records statistics in a lightweight manner that makes it appropriate for full-time production deployment. However, Darshan’s default characterization mechanism records information at a fixed granularity. We augment Darshan by proposing Darshan eXtended Tracing (DXT) for more detailed profiling of I/O software stacks. DXT enables users and administrators to vary the level of fidelity captured by Darshan at run time without modifying or recompiling applications. This capability facilitates systematic analysis on the I/O behavior of applications and can provide useful application kernel I/O traces to help advance parallel I/O research. We have demonstrated the power of DXT by obtaining a wide range of useful statistics for multiple case studies, and we further show that DXT is able to do so same with negligible overhead.

97 MATHEMATICS AND COMPUTING↗