Search NASA⌕ Search
Home/Archive/DOE OSTI

DOE OSTI · 1490709

DXT: Darshan eXtended Tracing

Xu, Cong·Snyder, Shane·Kulkarni, Omkar·Venkatesan, Vishwanath·Carns, Phillip·Byna, Surendra·Sisneros, Robert·Chadalavada, Kalyana
View original source ↗Read source document ↗Export metadata ↓

Abstract

As modern supercomputers evolve to exascale, their I/O subsystems are becoming increasingly complex, making optimization of I/O for scientific applications a daunting task. Although I/O profiling tools facilitate the process of optimizing application I/O performance, legacy profiling tools lack flexibility in their level of detail and ability to correlate traces with other sources of data. Additionally, a lack of robust trace analysis tools makes it difficult to derive actionable insights from large-scale I/O traces. Darshan is an HPC I/O characterization tool that records statistics in a lightweight manner that makes it appropriate for full-time production deployment. However, Darshan’s default characterization mechanism records information at a fixed granularity. We augment Darshan by proposing Darshan eXtended Tracing (DXT) for more detailed profiling of I/O software stacks. DXT enables users and administrators to vary the level of fidelity captured by Darshan at run time without modifying or recompiling applications. This capability facilitates systematic analysis on the I/O behavior of applications and can provide useful application kernel I/O traces to help advance parallel I/O research. We have demonstrated the power of DXT by obtaining a wide range of useful statistics for multiple case studies, and we further show that DXT is able to do so same with negligible overhead.

Explore related subjects

97 MATHEMATICS AND COMPUTING

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Xu, Cong, Snyder, Shane, Kulkarni, Omkar, Venkatesan, Vishwanath, Carns, Phillip, Byna, Surendra, Sisneros, Robert, Chadalavada, Kalyana. 2019-01-09. DXT: Darshan eXtended Tracing. https://www.osti.gov/biblio/1490709

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related reports

DOE OSTI2026

TANTE: Time-adaptive operator learning via neural Taylor expansion

Operator learning for time-dependent partial differential equations (PDEs) has seen rapid progress in recent years, enabling efficient approximation of complex spatiotemporal dynamics. However, most existing methods rely on fixed time step sizes during rollout, which limits their ability to adapt to varying temporal complexity and often leads to error accumulation. In this work, we propose the Time-Adaptive Transformer with Neural Taylor Expansion (TANTE), a novel operator-learning framework that produces continuous-time predictions with adaptive step sizes. TANTE predicts future states by performing a Taylor expansion at the current state, where neural networks learn both the higher-order temporal derivatives and the local radius of convergence. This allows the model to dynamically adjust its rollout based on the local behavior of the solution, thereby reducing cumulative error and improving computational efficiency. We demonstrate the effectiveness of TANTE across a wide range of PDE benchmarks, achieving superior accuracy and adaptability compared to fixed-step baselines, delivering accuracy gains of 60-80 % and speed-ups of 30-40 % at inference time.

97 MATHEMATICS AND COMPUTING↗
DOE OSTI2026

Structured illumination for surface-resolved grazing-incidence X-ray scattering

Grazing-incidence (GI) scattering techniques are widely used to characterize thin films, offering high surface sensitivity and insight into morphology and structure. However, these approaches typically provide statistical averaged information due to elongated footprint or limited spatial resolution due to beam size. Here we introduce a method that combines structured illumination with GI X-ray scattering and leverages our computational imaging approach to resolve local structural details. We demonstrate that our method captures local features of an organic semiconductor thin film without the need for sample rotation as in tomography. The method expands GI techniques from statistical averaging to high-resolution imaging, thereby providing the capability for detailed analysis of local material properties, such as domain shape, orientation and polymorphism, which are critical for advancing material design towards more efficient and tailored materials.

97 MATHEMATICS AND COMPUTING↗