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Stott, F. R.

Publications and source records attributed to Stott, F. R..

List of Preferred Electronic Parts

Components passed stringent qualification tests tabulated and described. Destructive and nondestructive qualification testing confirmed parts capable of withstanding spacecraft environments without excessive degradation and have stable characteristics during operating lives. Testing assessed effects of electrical, environmental, and mechanical stresses in various levels and time durations.

Covey, R. E.

Hardware Fault Simulator Generates Test Vectors For Complex IC's

Report describes technique using fault simulator implemented entirely in hardware to generate and optimize test vectors for microprocessor. Hardware fault simulator approach reduces test time, while maintaining high reliability in detecting faults.

Timoc, C. C.

JPL preferred parts list: Reliable electronic components

The JPL Preferred Parts List was prepared to provide a basis for selection of electronic parts for JPL spacecraft programs. Supporting tests for the listed parts were designed to comply with specific spacecraft environmental requirements. The list tabulates the electronic, magnetic, and electromechanical parts applicable to all JPL electronic equipment wherein reliability is a major concern. The parts listed are revelant to equipment supplied by subcontractors as well as fabricated at the laboratory.

Covey, R. E.

Test vectors development and optimization for a microprocessor

This paper describes a method for generating and optimizing test vectors for a microprocessor, with the aid of a fault simulator implemented entirely by hardware. The development and optimization of test vectors has been done on a tester, with the fault simulator plugged directly into the test head. The fault simulator is capable of automatically injecting over a thousand single or multiple stuck faults in the sequential and combinatorial parts of the microprocessor. The test vectors developed by a programmer working interactively with the tester were applied through the tester to the fault simulator, and the percent of faults detected was measured. The vectors were developed and optimized for the 1802 microprocessor, with the objective of detecting 100% of the single stuck faults with a minimum set of vectors. Experimental results show that 99.7% of the single stuck faults are being detected with approximately 14,000 vectors.

Timoc, C. C.