Engineering topics

Taylor, Daniel M.

Publications and source records attributed to Taylor, Daniel M..

10 records

NASA NTRS1995

Improved Bakeout Chambers Within Vacuum Chambers

Improved bakeout chamber incorporates hardware features that, in conjunction with improved bakeout procedure, reduce spurious contamination and increase accuracy of contamination measurements. When operated according to revised bakeout procedure, they yield measurements of contamination on vacuum-bake test articles more accurate than available previously, and potential for post-bake recontamination of vacuum-baked articles reduced. These chambers improved versions of one described in "Bakeout Chamber Within Vacuum Chamber" (NPO-18959). By enclosing test article in enclave and keeping walls of enclave hotter than test article during bakeout, one prevents condensation of contaminants on inner walls of enclave.

Johnson, Kenneth R.↗

NASA NTRS1995

Bakeout Chamber Within Vacuum Chamber

Vacuum-bakeout apparatus for decontaminating and measuring outgassing from pieces of equipment constructed by mounting bakeout chamber within conventional vacuum chamber. Upgrade cost effective: fabrication and installation of bakeout chamber simple, installation performed quickly and without major changes in older vacuum chamber, and provides quantitative data on outgassing from pieces of equipment placed in bakeout chamber.

Taylor, Daniel M.↗

NASA NTRS1992

A new approach for performing contamination control bakeouts in JPL thermal vacuum test chambers

Contamination control requirements for the Wide Field/Planetary Camera II (WF/PC II) are necessarily stringent to protect against post-launch contamination of the sensitive optical surfaces, particularly the cold charge coupled device (CCD) imaging surfaces. Typically, thermal vacuum test chambers have employed a liquid nitrogen (LN2) cold trap to collect outgassed contaminants. This approach has the disadvantage of risking recontamination of the test article from shroud offgassing during post-test warmup of the chamber or from any shroud warming of even a few degrees during the bakeout process. By using an enclave, essentially a chamber within a chamber, configured concentrically and internally within an LN2 shroud, a method was developed, based on a design concept by Taylor, for preventing recontamination of test articles during bakeouts and subsequent post-test warmup of the vacuum chamber. Enclaves for testing WF/PC II components were designed and fabricated, then installed in three of JPL's Environmental Test Lab chambers. The design concepts, operating procedures, and test results of this development are discussed.

Johnson, Kenneth R.↗

NASA NTRS1992

Condensation Of Volatile Contaminant In An Instrument

Report describes investigation of deposition of contaminant of cooled optical detectors in Wide-Field/Planetary Camera (WF/PC), an instrument in Hubble Space Telescope. To understand phenomenon, initially thought to be deposition of water from graphite/epoxy optical-bench material in instrument, researchers mounted several diagnostic instruments on access plate to monitor interior of WF/PC housing and optical bench. Temperature-controlled quartz-crystal microbalance (TQCM) measures adsorbed and desorbed volatile condensible material on surfaces in WF/PC.

Hansen, Patricia A.↗

NASA NTRS1990

Strategy for contamination control to improve Wide-Field/Planetary Camera far-ultraviolet performance

A multifaceted contamination control strategy has been developed for the second generated Wide-Field and Planetary Camera (WFPC-2) to improve the FUV stability by several orders of magnitude, compared to the first camera (WFPC-1). The strategy involves: improved on-orbit boil-off capability of the detector optics, added internal shielding and instrument venting, in-process subassembly vacuum bakeout at elevated temperatures, material substitution, sample testing in ultraclean vacuum facility, and internal instrument contamination-transport modeling. A science performance goal of 1 percent photometric accuracy at 1470 A over an extended time (of at least 30 days) has been established as a contamination control target for WFPC-2. The WFPC-2 is currently planned to be launched by the Shuttle in mid-1993 and replace the WFPC-1 which was recently launched with the HST.

Leschly, Kim↗

NASA NTRS1990

Analysis and interpretation of Wide Field Planetary Camera outgas data collected in the temperature range from -20 C to -100 C

The data from the Wide Field Planetary Camera (WFPC) are analyzed to determine the absolute source-emission parameters and contaminant reemission parameters of outgassing mass accumulation. The data correspond to the mass accumulated on a -100 C quartz crystal microbalance and then desorbed at -50 C as a function of time. The parameters investigated include contaminant mass, first-order rate constants, and characteristic energies. The data are modeled in terms of a minimum number of species characterized by source-rate and reemission-rate parameters. The modeling technique is found to produce adequate fits, and the contaminants that accumulate at -100 C and desorb at -50 C do not accumulate at -50 C. The data analysis is found to be an adequate technique for assessing outgassing parameters for the prediction of WFPC internal contamination.

Barengoltz, Jack B.↗

NASA NTRS1990

The JPL Molecular Contamination Investigation Facility

The Molecular Contamination Investigation Facility (MCIF) is discussed in terms of its use for improving the far-UV performance of a camera and its broader applications. The MCIF incorporates two independent vacuum systems with sample isolation chambers and regulated heat exchangers as well as three quartz-crystal microbalances (QCMs) and a residual gas analyzer. One cryogenic QCM is heat sunk into an LN2 heat exchanger, while the others are thermoelectrically controlled and are heat sunk into a regulated heat exchanger. Outgas accumulation can be measured at three surface temperatures between -180 and 80 C simultaneously, and results are presented for the testing of 34 samples in a large-chambered system and 22 samples in a system with a smaller chamber. The MCIF results provide a database for fabrication processes, material selection, maximum bakeout temperatures, and the development of an ultraclean bakeout chamber.

Taylor, Daniel M.↗

NASA NTRS1990

Modeling of internal contaminant deposition on a cold instrument sensor

A model is developed to predict the deposition of contaminants on the CCD sensors of the Wide Field Planetary Camera to determine expected performance parameters. Contaminant deposition due to internal instrument sources is considered as is the mechanism of transport to the CCDs themselves. The Contamination Analysis Program (CAP) model considers deposition and reemission kinetics, nodal containment sources, and internodal shape factors related to line-of-sight transport. Indirect transport is also accounted for in the CAP model by considering the effect of diffuse reflection at internodal exchanges. The effective total transport factors for each node-to-node exchange is precalculated to reduce the effective number of nodes and reducing run time of the CAP program. The method is applied to four distinct conditions and is found to be suitable for the analysis of internal self-contamination. Cold traps, venting, and vacuumlike design are factors which are found to be important for cold-sensitive sensors.

Barengoltz, Jack B.↗

NASA NTRS1988

WF/PC internal molecular contamination during system thermal-vacuum test

During the recent system thermal vacuum test of the Wide-Field/Planetary Camera (WF/PC), instrumentation was added to the WF/PC to characterize the internal molecular contamination and verify the instrument throughput down to 1470 angstroms. Analysis of data elements revealed two contaminants affecting the far-ultraviolet (FUV) performance of the WF/PC. The one contaminant (heavy volatile) is correlated with the electronic and housing temperature, and the contamination is significantly reduced when the electronics are operated below plus 8 degrees to plus 10 degrees C. The other contaminant (light volatile) is controlled by the heat pipe temperature, and the contamination is significantly reduced when the Thermal Electric Cooler (TEC) hot-junction temperature is below minus 40 degrees to minus 50 degrees C. The utility of contamination sensors located behind instruments during system tests was demonstrated.

Taylor, Daniel M.↗

NASA NTRS1988

Characterization of a graphite epoxy optical bench during thermal vacuum cycling

In-situ monitoring of the Wide-Field/Planetary Camera, a Hubble Space Telescope science instrument, was performed in a vacuum environment to better understand the formation of ice on cooled optical detectors. Several diagnostic instruments were mounted on an access plate to view the interior of the instrument housing and the graphite epoxy optical bench. The instrumentation chosen and the rationale for choosing the instrumentation are discussed. In addition, the performance of the instrumentation during monitoring operations is discussed.

Hansen, Patricia A.↗