Toriumi, Koshiro | Search NASA

DOE OSTI2010

Submicrometer Single Crystal Diffractometry for Highly Accurate Structure Determination

Submicrometer single crystal diffractometry for highly accurate structure determination was developed using the extremely stable and highly brilliant synchrotron radiation from SPring-8. This was achieved using a microbeam focusing system and the submicrometer precision low-eccentric goniometer system. We demonstrated the structure analyses with 2x2x2 {mu}m{sup 3} cytidine, 600x600x300 nm{sup 3} BaTiO{sub 3}, and 1x1x1 {mu}m{sup 3} silicon. The observed structure factors of the silicon crystal were in agreement with the structure factors determined by the Pendelloesung method and do not require absorption and extinction corrections.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

DOE OSTI2010

Pump-probe X-ray Diffraction Technique for Irreversible Phase Change Materials

We have developed a pump-probe X-ray diffraction measurement system for a sample with irreversible reaction at BL40XU in the SPring-8. The system mainly consists of a time-resolved measurement system, a sample disk rotation system, and an X-ray microbeam system. The time-resolved measurement system gives time resolution of 50 ps in laser-pump and X-ray probe method. A sample disk rotation system for repetitive measurements was made to give a virgin sample for every measurement. The number of repetitions for one sample disk was increased by using the X-ray microbeam technique. To keep the overlap of the X-ray microbeam and the laser beam on the sample surface during the disk rotation, the sample disk rotation system was constructed by a low-eccentric spindle motor. By using this system, the pump-probe X-ray diffraction measurement was demonstrated for a crystallization process of a DVD material.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗