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DOE OSTI · 21410217

Submicrometer Single Crystal Diffractometry for Highly Accurate Structure Determination

Yasuda, Nobuhiro·Fukuyama, Yoshimitsu·Kimura, Shigeru·Toriumi, Koshiro·Takata, Masaki
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Abstract

Submicrometer single crystal diffractometry for highly accurate structure determination was developed using the extremely stable and highly brilliant synchrotron radiation from SPring-8. This was achieved using a microbeam focusing system and the submicrometer precision low-eccentric goniometer system. We demonstrated the structure analyses with 2x2x2 {mu}m{sup 3} cytidine, 600x600x300 nm{sup 3} BaTiO{sub 3}, and 1x1x1 {mu}m{sup 3} silicon. The observed structure factors of the silicon crystal were in agreement with the structure factors determined by the Pendelloesung method and do not require absorption and extinction corrections.

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46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGYABSORPTIONACCURACYALKALINE EARTH METAL COMPOUNDSAZINESBARIUM COMPOUNDSBREMSSTRAHLUNGCORRECTIONSCRYSTALSCYTIDINEDIFFRACTOMETERSDIMENSIONLESS NUMBERSELECTROMAGNETIC RADIATIONELEMENTSGONIOMETERSHETEROCYCLIC COMPOUNDSIONIZING RADIATIONSMEASURING INSTRUMENTSMONOCRYSTALSNUCLEOSIDESNUCLEOTIDESOPTICSORGANIC COMPOUNDSORGANIC NITROGEN COMPOUNDSOXYGEN COMPOUNDSPLATESPYRIMIDINESRADIATION SOURCESRADIATIONSRIBOSIDESSEMIMETALSSILICONSORPTIONSPRING-8 STORAGE RINGSTORAGE RINGSSTRUCTURE FACTORSSYNCHROTRON RADIATIONSYNCHROTRON RADIATION SOURCESTITANATESTITANIUM COMPOUNDSTRANSITION ELEMENT COMPOUNDSX RADIATION

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Yasuda, Nobuhiro, Fukuyama, Yoshimitsu, Kimura, Shigeru, Toriumi, Koshiro, Takata, Masaki. 2010-06-23. Submicrometer Single Crystal Diffractometry for Highly Accurate Structure Determination. https://doi.org/10.1063/1.3463161

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