Introduction to computer aided reliability data analysis
Computer program for component quality control and reliability data analysis
Toye, C. R.↗
Engineering topics
Toye, C. R.
Publications and source records attributed to Toye, C. R..
Computerized Arrhenius reliability extrapolation techniques
Computerized Arrhenius equation component reliability extrapolation techniques
Toye, C. R.↗
Failure rates for accelerated acceptance testing of silicon transistors
Extrapolation tables for the control of silicon transistor product reliability have been compiled. The tables are based on a version of the Arrhenius statistical relation and are intended to be used for low- and medium-power silicon transistors.
Toye, C. R.↗