NASA NTRS · 19680000497
Failure rates for accelerated acceptance testing of silicon transistors
Abstract
Extrapolation tables for the control of silicon transistor product reliability have been compiled. The tables are based on a version of the Arrhenius statistical relation and are intended to be used for low- and medium-power silicon transistors.
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Toye, C. R.. 1968-11-01. Failure rates for accelerated acceptance testing of silicon transistors. https://ntrs.nasa.gov/citations/19680000497
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