DOE OSTI2025Analysis of MOS capacitor with p layer with TCAD simulationNot AvailableUnno, Y. (ORCID:0000000241708537)↗
DOE OSTI2023Effect of irradiation and annealing performed with bias voltage applied across the coupling capacitors on the interstrip resistance of ATLAS ITk silicon strip sensorsNot AvailableKroll, J. (ORCID:0000000162153326)↗