Engineering topics
Publications and source records attributed to Xapsos, M. A..
A total dose analysis for exposure of electronic parts at the box level is presented for the Hubble Space Telescope. This was done using solid angle sectoring/3-dimensional ray trace and Monte Carlo radiation transport simulations. Results are discussed in terms of parts that are potential total dose concerns.
A confidence level based approach to total dose radiation hardness assurance is presented for spacecraft electronics. It is applicable to both ionizing and displacement damage dose. Results are compared to the traditional approach that uses radiation design margin and advantages of the new approach are discussed.
Variability of the space radiation environment is investigated with regard to parts categorization for total dose hardness assurance methods. It is shown that it can have a significant impact. A modified approach is developed that uses current environment models more consistently and replaces the design margin concept with one of failure probability.
Total ionizing dose exposure of electronic parts in the Hubble Space Telescope is analyzed using 3-D ray trace and Monte Carlo simulations. Results are discussed along with other potential failure mechanisms for science operations.
No abstract available
Solar energetic particle events pose a radiation hazard for space crews and a risk of harmful radiation effects in spacecraft electronics. To assess these risks, engineers need to know the worst-case environment that they must plan for or design to withstand. Depending on the application, engineers may need to know the instantaneous worst-case environment, the radiation environment that accumulates during one solar particle event or the cumulative worst-case environment for their entire mission. Also, depending on their application, they will need to know this environment at a confidence level which they will specify. We will present a probabilistic model for the peak fluxes, event-integrated fluences and mission-integrated fluences for solar protons and heavy ions. The model will provide these worst-case environments at user-specified confidence levels. Examples of the use of this model will also be shown.
Probabilistic Models of Solar Particle Events (SPEs) are used in space mission design studies to provide a description of the worst-case radiation environment that the mission must be designed to tolerate.The models determine the worst-case environment using a description of the mission and a user-specified confidence level that the provided environment will not be exceeded. This poster will focus on completing the existing suite of models by developing models for peak flux and event-integrated fluence elemental spectra for the Z>2 elements. It will also discuss methods to take into account uncertainties in the data base and the uncertainties resulting from the limited number of solar particle events in the database. These new probabilistic models are based on an extensive survey of SPE measurements of peak and event-integrated elemental differential energy spectra. Attempts are made to fit the measured spectra with eight different published models. The model giving the best fit to each spectrum is chosen and used to represent that spectrum for any energy in the energy range covered by the measurements. The set of all such spectral representations for each element is then used to determine the worst case spectrum as a function of confidence level. The spectral representation that best fits these worst case spectra is found and its dependence on confidence level is parameterized. This procedure creates probabilistic models for the peak and event-integrated spectra.
A 1 GeV/u Fe-56 Ion beam allows for true 90 deg. tilt irradiations of various microelectronic components and reveals relevant upset trends for an abundant element at the galactic cosmic ray (GCR) flux-energy peak.
Single event latchup (SEL) in a 65 nm CMOS SRAM technology is observed and sensitivity is shown to be a strong function of lateral beam orientation, angle of incidence, and temperature. The significance of these results are discussed and the foundation for a predictive model of SEL is laid out for use with the MRED tool.
A well-collapse source-injection mode for SRAM SEU is demonstrated through TCAD modeling. The recovery of the SRAM s state is shown to be based upon the resistive path from the p+-sources in the SRAM to the well. Multiple cell upset patterns for direct charge collection and the well-collapse source-injection mechanisms are then predicted and compared to recent SRAM test data.
They construct a Bayesian risk metric with a method that allows for efficient and systematic use of all relevant information and provides rational basis for RHA decisions in terms of costs and mission requirements
We describe an analytical model for calculating NIEL for heavy ions based upon screened Coulomb potentials. The model applies to any incident ion on any target material in the Coulombic limit.
A statistical model for cumulative solar proton event fluences and for worst-case flux during space missions is presented. New features include the solar minimum time period and proton energy spectra that extend to higher energies.
Calculations of NIEL are reported for heavy ions prominent in the space environment for energies ranging from 200 MeV per nucleon to 2 GeV per nucleon.
Calculations of NIEL are reported for heavy ions prominent in the space environment for energies ranging from 200 MeV per nucleon to 2 GeV per nucleon.
The proton induced NIELs for representative spacecraft materials are presented for the energy range between the displacement thresholds of the material to 1000 MeV. All interaction mechanisms (Coulomb and nuclear elastic/inelastic) are fully accounted in the present NIEL calculations.
The proton induced NIEL for representative device materials are presented for the energy range between 1 keV to 1000 MeV.
This viewgraph presentation provides information on radiation tests on encoders intended for a constellation of microsatellites. The encoders use CMOS Ultra-Low Power Radiation Tolerant (CULPRiT) technology. The presentation addresses power consumption, radiation dosage, and Single Event Upset (SEU).