NASA NTRS · 20170005803
Confidence Level Based Approach to Total Dose Specification for Spacecraft Electronics
Abstract
A confidence level based approach to total dose radiation hardness assurance is presented for spacecraft electronics. It is applicable to both ionizing and displacement damage dose. Results are compared to the traditional approach that uses radiation design margin and advantages of the new approach are discussed.
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Xapsos, M. A., Stauffer, C., Phan, A., McClure, S. S., Ladbury, R. L., Pellish, J. A., Campola, M. J., Label, K. A.. 2017-06-26. Confidence Level Based Approach to Total Dose Specification for Spacecraft Electronics. https://ntrs.nasa.gov/citations/20170005803
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