A versatile high-speed x-ray microscope for high-throughput sub-10nm Imaging
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36 MATERIALS SCIENCE↗
Engineering topics
Xu, Huijuan
Publications and source records attributed to Xu, Huijuan.
A versatile high-speed x-ray microscope for sub-10 nm imaging
We have developed a next-generation scanning x-ray microscope RASMI (RApid Scanning Microscopy Instrument) for high-throughput tomographic imaging. RASMI is installed at the hard x-ray nanoprobe beamline at NSLS-II and is capable of manipulating 1D multilayer Laue lenses (MLLs) and 2D optics (both zone plates and monolithically assembled 2D MLLs). The sample scanning stage utilizes line-focusing interferometry as an encoder while performing fly-scanning data acquisition. The system can be configured for both position- and time-triggering modes during fly-scanning. The microscope demonstrated a detector-limited data acquisition rate of 1.25 kHz during ptychography measurements. The initial x-ray results yielded a sample-limited resolution of ∼6 nm in 2D. RASMI can be adopted for in-vacuum applications and is a foundation for the next-generation scanning microscopy systems to be developed and commissioned at NSLS-II.
36 MATERIALS SCIENCE↗
High-speed fly-scan capabilities for x-ray microscopy systems at NSLS-II
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36 MATERIALS SCIENCE↗