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Zhao, Feng

Publications and source records attributed to Zhao, Feng.

54 records · Page 3
All sourcesNASA NTRSDOE OSTI
NASA NTRS2011

Measuring Effective Leaf Area Index, Foliage Profile, and Stand Height in New England Forest Stands Using a Full-Waveform Ground-Based Lidar

Effective leaf area index (LAI) retrievals from a scanning, ground-based, near-infrared (1064 nm) lidar that digitizes the full return waveform, the Echidna Validation Instrument (EVI), are in good agreement with those obtained from both hemispherical photography and the Li-Cor LAI-2000 Plant Canopy Analyzer. We conducted trials at 28 plots within six stands of hardwoods and conifers of varying height and stocking densities at Harvard Forest, Massachusetts, Bartlett Experimental Forest, New Hampshire, and Howland Experimental Forest, Maine, in July 2007. Effective LAI values retrieved by four methods, which ranged from 3.42 to 5.25 depending on the site and method, were not significantly different ( b0.1 among four methods). The LAI values also matched published values well. Foliage profiles (leaf area with height) retrieved from the lidar scans, although not independently validated, were consistent with stand structure as observed and as measured by conventional methods. Canopy mean top height, as determined from the foliage profiles, deviated from mean RH100 values obtained from the Lidar Vegetation Imaging Sensor (LVIS) airborne large-footprint lidar system at 27 plots by .0.91 m with RMSE=2.04 m, documenting the ability of the EVI to retrieve stand height. The Echidna Validation Instrument is the first realization of the Echidna lidar concept, devised by Australia's Commonwealth Scientific and Industrial Research Organization (CSIRO), for measuring forest structure using full-waveform, ground-based, scanning lidar.

Zhao, Feng↗
NASA NTRS2010

Swept Frequency Laser Metrology System

A swept frequency laser ranging system having sub-micron accuracy that employs multiple common-path heterodyne interferometers, one coupled to a calibrated delay-line for use as an absolute reference for the ranging system. An exemplary embodiment uses two laser heterodyne interferometers to create two laser beams at two different frequencies to measure distance and motions of target(s). Heterodyne fringes generated from reflections off a reference fiducial X(sub R) and measurement (or target) fiducial X(sub M) are reflected back and are then detected by photodiodes. The measured phase changes Delta phi(sub R) and Delta phi (sub m) resulting from the laser frequency swept gives target position. The reference delay-line is the only absolute reference needed in the metrology system and this provides an ultra-stable reference and simple/economical system.

Zhao, Feng↗
NASA NTRS2010

Measuring Cyclic Error in Laser Heterodyne Interferometers

An improved method and apparatus have been devised for measuring cyclic errors in the readouts of laser heterodyne interferometers that are configured and operated as displacement gauges. The cyclic errors arise as a consequence of mixing of spurious optical and electrical signals in beam launchers that are subsystems of such interferometers. The conventional approach to measurement of cyclic error involves phase measurements and yields values precise to within about 10 pm over air optical paths at laser wavelengths in the visible and near infrared. The present approach, which involves amplitude measurements instead of phase measurements, yields values precise to about .0.1 microns . about 100 times the precision of the conventional approach. In a displacement gauge of the type of interest here, the laser heterodyne interferometer is used to measure any change in distance along an optical axis between two corner-cube retroreflectors. One of the corner-cube retroreflectors is mounted on a piezoelectric transducer (see figure), which is used to introduce a low-frequency periodic displacement that can be measured by the gauges. The transducer is excited at a frequency of 9 Hz by a triangular waveform to generate a 9-Hz triangular-wave displacement having an amplitude of 25 microns. The displacement gives rise to both amplitude and phase modulation of the heterodyne signals in the gauges. The modulation includes cyclic error components, and the magnitude of the cyclic-error component of the phase modulation is what one needs to measure in order to determine the magnitude of the cyclic displacement error. The precision attainable in the conventional (phase measurement) approach to measuring cyclic error is limited because the phase measurements are af-

Ryan, Daniel↗
NASA NTRS2010

Sub-Aperture Interferometers

Sub-aperture interferometers -- also called wavefront-split interferometers -- have been developed for simultaneously measuring displacements of multiple targets. The terms "sub-aperture" and "wavefront-split" signify that the original measurement light beam in an interferometer is split into multiple sub-beams derived from non-overlapping portions of the original measurement-beam aperture. Each measurement sub-beam is aimed at a retroreflector mounted on one of the targets. The splitting of the measurement beam is accomplished by use of truncated mirrors and masks, as shown in the example below

Zhao, Feng↗
NASA NTRS2007

A Precision Deployable Aperture System Facility

This paper describes an overview of the precision environment test enclosure for testing the structures, a metrology system for absolute measurement at the micron level and the formulation of a modeling methodology that integrates the measurement of aperture components or subsystems w1th models for direct validation.

modeling↗
NASA NTRS2006

Laser Metrology Sensing and Control for Large Segmented-Mirror Telescopes

Described an optical hexapod metrology concept: a) Can work together with edge sensors; b) Can measure M1 - M2 distance and M1 global curvature. Swept-frequency laser metrology system: a) Absolute optical path length measurement (approx.1 micron); b) Relative optical path length measurement (approx.nm) Air turbulence is a concern for ground-based telescopes and needs further study.

large telescopes↗
NASA NTRS2006

An analysis of the phase dispersion in the symmetric beam combiner

An astronomical beam combiner combines the two beams of starlight to form white-light fringes. It is desirable that the dispersion of the beam combiner be minimized across the observation wavelength range. We present here an analysis of the phase dispersion from coatings for a symmetric beam combiner. The sensitivity of the dispersion to a slight mismatch in beamsplitter coatings is also studied.

coatings↗
NASA NTRS2005

Mask Design for the Space Interferometry Mission Internal Metrology

This slide presentation reviews the mask design used for the internal metrology of the Space Interferometry Mission (SIM). Included is information about the project, the method of measurements with SIM, the internal metrology, numerical model of internal metrology, wavefront examples, performance metrics, and mask design

interferometry↗
NASA NTRS2005

Estimation of Cyclic Error Due to Scattering in the Internal OPD Metrology of the Space Interferometry Mission

A common-path laser heterodyne interferometer capable of measuring the internal optical path difference (OPD) with accuracy of the order of 10 pm was demonstrated at JPL. To achieve this accuracy, the relative power received by the detector that is contributed by the scattering of light at the optical surfaces should be less than -97 dB. A method has been developed to estimate the cyclic error caused by the scattering of the optical surfaces. The result of the analysis is presented.

scattering↗
NASA NTRS2005

Estimation of cyclic error due to scattering in the internal OPD metrology of the Space Interferometry Mission

A common-path laser heterodyne interferometer capable of measuring the internal OPD with accuracy of the order of 10 picometers was demonstrated at JPL. To achieve this accuracy, the relative power received by the detector that is contributed by the scattering of light at the optical surfaces should be less than -97 dB. A method has been developed to estimate the cyclic error caused by the scattering of the optical surfaces. The result of the analysis is presented.

Zhao, Feng↗
NASA NTRS2004

Laser Metrology in the Micro-Arcsecond Metrology Testbed

The Space Interferometer Mission (SIM), scheduled for launch in 2009, is a space-born visible light stellar interferometer capable of micro-arcsecond-level astrometry. The Micro-Arcsecond Metrology testbed (MAM) is the ground-based testbed that incorporates all the functionalities of SIM minus the telescope, for mission-enabling technology development and verification. MAM employs a laser heterodyne metrology system using the Sub-Aperture Vertex-to-Vertex (SAVV) concept. In this paper, we describe the development and modification of the SAVV metrology launchers and the metrology instrument electronics, precision alignments and pointing control, locating cyclic error sources in the MAM testbed and methods to mitigate the cyclic errors, as well as the performance under the MAM performance metrics.

interferometry↗
NASA NTRS2004

Metrology system for the Terrestrial Planet Finder Coronagraph

The Terrestrial Planet Finder (TPF) employs an aggressive coronagraph designed to obtain better than 1e-10 contrast inside the third Airy ring. Minute changes in low-order aberration content scatter significant light at this position. One implication is the requirement to control low-order aberrations induced by motion of the secondary mirror relative to the primary mirror; sub-nanometer relative positional stability is required. We propose a 6-beam laser truss to monitor the relative positions of the two mirrors. The truss is based on laser metrology developed for the Space Interferometry Mission.

Terrestrial Planet Finder (TPF)↗
NASA NTRS2004

Interferometric apparatus for ultra-high precision displacement measurement

A high-precision heterodyne interferometer measures relative displacement by creating a thermally-insensitive system generally not subject to polarization leakage. By using first and second light beams separated by a small frequency difference (.DELTA.f), beams of light at the first frequency (f.sub.0) are reflected by co-axial mirrors, the first mirror of which has a central aperture through which the light is transmitted to and reflected by the second mirror. Prior to detection, the light beams from the two mirrors are combined with light of the second and slightly different frequency. The combined light beams are separated according to the light from the mirrors. The change in phase (.DELTA..phi.) with respect to the two signals is proportional to the change in distance of Fiducial B by a factor of wavelength (.lambda.) divided by 4.pi. (.DELTA.L=.lambda..DELTA..phi.1/(4.pi.)). In a second embodiment, a polarizing beam splitting system can be used.

Zhao, Feng↗
NASA NTRS2003

The Micro-Arcsecond Metrology Testbed

The Micro-Arcsecond Metrology (MAM) testbed is a ground-based system of optical and electronic equipment for testing components, systems, and engineering concepts for the Space Interferometer Mission (SIM) and similar future missions, in which optical interferometers will be operated in outer space. In addition, the MAM testbed is of interest in its own right as a highly precise metrological system. The designs of the SIM interferometer and the MAM testbed reflect a requirement to measure both the position of the starlight central fringe and the change in the internal optical path of the interferometer with sufficient spatial resolution to generate astrometric data with angular resolution at the microarcsecond level. The internal path is to be measured by use of a small metrological laser beam of 1,319-nm wavelength, whereas the position of the starlight fringe is to be estimated by use of a charge-coupled-device (CCD) image detector sampling a large concentric annular beam. For the SIM to succeed, the optical path length determined from the interferometer fringes must be tracked by the metrological subsystem to within tens of picometers, through all operational motions of an interferometer delay line and siderostats. The purpose of the experiments performed on the MAM testbed is to demonstrate this agreement in a large-scale simulation that includes a substantial portion of the system in the planned configuration for operation in outer space. A major challenge in this endeavor is to align the metrological beam with the starlight beam in order to maintain consistency between the metrological and starlight subsystems at the system level. The MAM testbed includes an optical interferometer with a white light source, all major optical components of a stellar interferometer, and heterodyne metrological sensors. The aforementioned subsystems are installed in a large vacuum chamber in order to suppress atmospheric and thermal disturbances. The MAM is divided into two distinct subsystems: the test article (TA), which is the interferometer proper, and the inverse interferometer pseudo-star (IIPS), which synthesizes the light coming from a distant target star by providing spatially coherent wavefronts out of two mirrors, separated by the MAM baseline, that feed directly into two siderostats that are parts of the TA. The two feed mirrors of the IIPS are articulated (in translation and tilt) in order to simulate stars located at different orientations in space, while still illuminating the TA siderostats. The spectrum of the simulated starlight of the IIPS corresponds to that of a blackbody at a temperature of about 3,100 K.

Goullioud, Renaud↗
NASA NTRS2003

Interferometer for Measuring Displacement to Within 20 pm

An optical heterodyne interferometer that can be used to measure linear displacements with an error <=20 pm has been developed. The remarkable accuracy of this interferometer is achieved through a design that includes (1) a wavefront split that reduces (relative to amplitude splits used in other interferometers) self interference and (2) a common-optical-path configuration that affords common-mode cancellation of the interference effects of thermal-expansion changes in optical-path lengths. The most popular method of displacement- measuring interferometry involves two beams, the polarizations of which are meant to be kept orthogonal upstream of the final interference location, where the difference between the phases of the two beams is measured. Polarization leakages (deviations from the desired perfect orthogonality) contaminate the phase measurement with periodic nonlinear errors. In commercial interferometers, these phase-measurement errors result in displacement errors in the approximate range of 1 to 10 nm. Moreover, because prior interferometers lack compensation for thermal-expansion changes in optical-path lengths, they are subject to additional displacement errors characterized by a temperature sensitivity of about 100 nm/K. Because the present interferometer does not utilize polarization in the separation and combination of the two interfering beams and because of the common-mode cancellation of thermal-expansion effects, the periodic nonlinear errors and the sensitivity to temperature changes are much smaller than in other interferometers

Zhao, Feng↗