Investigation of subthreshold leakage current and single-particle effects in gate-all-around field-effect transistors
Electronic transport and noise measurements in GAAFET devices pre and post-radiation
Titze, Michael↗
Engineering topics
Zhou, Huimei
Publications and source records attributed to Zhou, Huimei.
TID Response of IBM Gate-All-Around Stacked Nanosheet Transistors
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Vidana, Aldo↗
Probing Radiation Effects in Gate-All-Around MOSFETs using Focused Particle Beams
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Titze, Michael↗