DOE OSTI · 2585228
Probing Radiation Effects in Gate-All-Around MOSFETs using Focused Particle Beams
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Titze, Michael, Mamaluy, Denis, Modine, Normand A., Belianinov, Alex Andrei, Su, Shei Sia, Vizkelethy, Gyorgy, Wampler, William R., Hehr, Brian Douglas, Wang, Miaomiao, Zhou, Huimei, Narayanan, Vijay, Bielejec, Edward Salvatore, Arghavani, Reza. 2024-05-01. Probing Radiation Effects in Gate-All-Around MOSFETs using Focused Particle Beams. https://doi.org/10.2172/2585228
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