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Zortman, William A.

Publications and source records attributed to Zortman, William A..

The Digital Assurance for High Consequence Systems (DAHCS) Mission Campaign Whitepaper

The DAHCS (pronounced “Dax”) MC is a 7-year, $\$$45 million research portfolio within Sandia’s Laboratory Directed Research and Development program. The DAHCS MC arose in response to a great need: to ensure that the use of digital technologies does not weaken our nation’s high consequence systems. Digital technologies offer many benefits in speed, cost, and flexibility, and we seek to reap those benefits without introducing new system failures. However, digital technologies cannot be evaluated the same way as analog technologies. Initiatives across the nation highlight the capability gap that prevents efficient, effective digital assurance. The Challenge Today’s digital assurance tools, techniques, and methods are inadequate to confidently characterize, assess, and manage digital risk; they are ad hoc, slow, costly, and rarely scalable to increasingly complex digital technologies. The rapidly evolving cyber threat landscape exacerbates this problem because digital assurance now must secure against digital risks now and in the future, including those introduced by rapidly evolving technologies, adversaries, and systems.

97 MATHEMATICS AND COMPUTING↗

Integrated circuit authentication from a die material measurement

The various technologies presented herein relate to measuring a signal generated by a die-based test circuit incorporated into an IC and utilizing the measured signal to authenticate the IC. The signal can be based upon a sensor response generated by the test circuit fabricated into the die, wherein the sensor response is based upon a property of the die material. The signal can be compared with a reference value obtained from one or more test circuit(s) respectively located on one or more reference dies, wherein the reference dies are respectively cut from different wafers, and the location at which the reference dies were cut is known. If the measured signal matches the reference value, the die is deemed to be from the same cut location as the dies from which the reference value was obtained. If the measured signal does not match the reference value, the die is not authenticated.

Zortman, William A.↗