NASA NTRS · 19680049674
Field-electron-microscopy studies of cesium layers on various refractory metals - Work function change.
Abstract
Work function variation with Cs layer coverage on W, Mo, Re and Ni substrates, using field electron microscopes
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Strayer, R. W., Swanson, L. W.. 1968-03-15. Field-electron-microscopy studies of cesium layers on various refractory metals - Work function change.. https://ntrs.nasa.gov/citations/19680049674
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