NASA NTRS · 19690022309
Silicon surface passivation for devices Quarterly status report
Abstract
Water film conductance feasibility studies for use in semiconductor device pre-screening
Keep this discovery
Explore connections, maps & timelines
Kuper, A. B.. 1969-06-01. Silicon surface passivation for devices Quarterly status report. https://ntrs.nasa.gov/citations/19690022309
Cite the original work for its findings. Save a collection to share your selection of sources.