Water contamination in thermal oxide on silicon
Water contaminating effects on thin thermal oxide passivated silicon planar devices
Holmberg, G. L.↗
Engineering topics
Kuper, A. B.
Publications and source records attributed to Kuper, A. B..
Improved solid state electron-charge-storage device
Storage device is applicable in memory systems and in high-resolution arrays for light-responsive image sensing. The device offers high yield in multiple arrays and allows charge release with light striking only the edge of a metal electrode.
Kuper, A. B.↗
Silicon surface passivation for devices Quarterly status report
Water film conductance feasibility studies for use in semiconductor device pre-screening
Kuper, A. B.↗
Silicon surface passivation for devices Quarterly status report
Water contamination in thermal oxide on silicon
Kuper, A. B.↗
Combined MOS and radiochemical analysis of impurities in SiO sub 2 on Si.
Oxide impurity effects causing potential shifts in Si covered by thick oxide layer studied with metal-oxide-Si electrical measurement and radiochemical analysis
Kuper, A. B.↗
Impurities and interface states in the silicon dioxide/silicon system Final report
Impurities and interface states in silicon surface and oxide systems
Kuper, A. B.↗
Impurities and interface states in the SiO2/Si system Final report
Impurities and interface states in silicon dioxide-silicon system
IMPURITY↗
SiO2/Si interface states at 77 deg K
Silicon oxide-silicon interface states at 77 degrees K
SILICON OXIDE↗
Impurities and Interface States in the Sio2/si System Semiannual Report
Impurities and interface states in silicon dioxide/silicon system
SILICON OXIDE↗
Positive and Negative Ion Motion in Thermal Oxide on Silicon by Radiochemical and MOS ANALYSIS
Metal-oxide-silicon capacitor and radiochemical analyses of anion in sodium contamination failure mode
SODIUM BROMIDE↗