NASA NTRS · 19710000188
Analytical procedure for estimating reliability of randomly excited structures
Abstract
Analysis considers statistical variation of material strength and interactions between catastrophic and failure fatigue modes. Procedure employs concepts of fracture mechanics and extreme point processes associated with stationary narrow-band random vibrations.
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Heer, E., Yang, J.-N.. 1971-06-01. Analytical procedure for estimating reliability of randomly excited structures. https://ntrs.nasa.gov/citations/19710000188
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