NASA NTRS · 19710013764
Micrometeoroid penetration measuring device Patent
Abstract
Measuring micrometeroid depth of penetration into various materials
Keep this discovery
Explore connections, maps & timelines
Kinard, W. H., Laney, C. C., Jr., Siviter, J. H., Jr.. 1968-10-22. Micrometeoroid penetration measuring device Patent. https://ntrs.nasa.gov/citations/19710013764
Cite the original work for its findings. Save a collection to share your selection of sources.