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NASA NTRS · 19720023093

Development of high temperature gallium phosphide rectifiers

Abstract

Large area high performance, GaP rectifiers were fabricated by means of Zn diffusion into vapor phase epitaxial GaP. Devices with an active area of 0.01 sq cm typically exhibit forward voltages of 3 volts for a bias current of 1 ampere and have reverse breakdown voltages of 300 volts for temperatures from 27 C to 400 C. Typical device reverse saturation current at a reverse bias of 150 volts is less than 10 to the minus 9th power amp at 27 C and less than 0.000050 amp at 400 C.

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BibTeXRIS

Craford, M. G., Keune, D. L.. 1972-09-01. Development of high temperature gallium phosphide rectifiers. https://ntrs.nasa.gov/citations/19720023093

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