NASA NTRS · 19720039207
Search for anisotropic electrical properties in amorphous germanium.
Abstract
Measurement of low-field and high-field resistivity in amorphous Ge in both the planar and transverse directions on the same samples, whose thickness ranged from 0.4 to 4 microns. No anisotropy was found, suggesting that the voids recently described by Galeener (1971) may not play a significant role in these transport processes.
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Clark, A. H., Burke, T. J.. 1972-03-13. Search for anisotropic electrical properties in amorphous germanium.. https://ntrs.nasa.gov/citations/19720039207
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