NASA NTRS · 19720040959
Fast-interface-state losses in charge-coupled devices.
Abstract
A simple model is presented that makes it possible to predict signal losses in charge-coupled devices due to fast-interface-state trapping. Presented experimental losses in a twelve-bit two-phase charge-coupled device with overlapping Si and Al gates are shown to agree well with the prediction of the model.
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Carnes, J. E., Kosonocky, W. F.. 1972-04-01. Fast-interface-state losses in charge-coupled devices.. https://ntrs.nasa.gov/citations/19720040959
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