Off-line data analysis and data reduction from digitally controlled random test systems.

Abstract

This paper discusses the merits of employing the new computer-controlled random environment control systems for fast and efficient large-scale data analysis when they are not being used for test control. Hardware and software requirements are stated. Several of the more familiar frequency functions are defined from the Fourier coefficients, the main product of the Fourier processors used in these control systems. Another function, the probability density function, is defined and suggestions for its application are made. An analysis example is presented. Some programming tips are listed, and the accuracy and reliability of frequency analysis measurements are considered.