NASA NTRS · 19730009715
Moire patterns and two-dimensional aliasing in line scanner data acquisition systems
Abstract
The basic mechanism underlying the generation of Moire patterns in line scanner data acquisition systems is examined. A general expression is developed in terms of typical system parameters for the reproduced image of such systems and the interaction of the image spectrum; the raster frequency and digital sampling frequency of the A/D conversion process are discussed and examples given. Systems design requirements for avoiding Moire pattern generation and two-dimensional aliasing are discussed.
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Mcgillem, C. D., Riemer, T. E.. 1973-01-01. Moire patterns and two-dimensional aliasing in line scanner data acquisition systems. https://ntrs.nasa.gov/citations/19730009715
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