NASA NTRS · 19750000197
Bubble-domain circuit wafer evaluation coil set
Abstract
Coil structures have been designed to permit nondestructive testing of bubble wafers. Wafers can be electrically or optically inspected and operated from quasi-static frequency to maximum device operating frequency.
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Chen, T. T., Williams, J. L.. 1975-09-01. Bubble-domain circuit wafer evaluation coil set. https://ntrs.nasa.gov/citations/19750000197
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