NASA NTRS ยท 19750017133
Techniques of Final Preseal Visual Inspection
Abstract
A dissertation is given on the final preseal visual inspection of microcircuit devices to detect manufacturing defects and reduce failure rates in service. The processes employed in fabricating monolithic integrated circuits and hybrid microcircuits, various failure mechanisms resulting from deficiencies in those processes, and the rudiments of performing final inspection are outlined.
Keep this discovery
Explore connections, maps & timelines
Anstead, R. J.. 1975-01-01. Techniques of Final Preseal Visual Inspection. https://ntrs.nasa.gov/citations/19750017133
Cite the original work for its findings. Save a collection to share your selection of sources.