NASA NTRS · 19770034211
Migrated-gold resistive shorts in microcircuits
Abstract
Failures, failure modes and failure mechanisms related to the formation of migrated-gold resistive shorts (MGRS) in gold-metallized microcircuits will be described. Also, three different methods of screening devices for MGRS will be presented and the impact MGRS can have on device reliability will be discussed.
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Shumka, A., Piety, R. R.. 1975-01-01. Migrated-gold resistive shorts in microcircuits. https://ntrs.nasa.gov/citations/19770034211
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