NASA NTRS · 19780000001
Automated tester for MOS devices
Abstract
Automated system rapidly diagnoses MOS integrated circuits. Its programed electronics investigate transistor and cell characteristics to compile data needed for screening. Program can be changed rapidly to alter test procedures, test duration, and precision.
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Cockrum, R. H.. 1978-06-01. Automated tester for MOS devices. https://ntrs.nasa.gov/citations/19780000001
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