NASA NTRS · 19780000075
Surface examination of small particles
Abstract
Electron-microscopy specimen-preparation technique is used to study micron size particles. Process involves coating particles with vacuum-evaporated carbon, dissolving particles in solvent, then examining residue. Process is applicable to study of catalysts, nucleation and growth of metal oxides, and to determine chemical nature of lubricated surfaces after wear has occurred.
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Buzek, B. C., Glasgow, T. K.. 1978-06-01. Surface examination of small particles. https://ntrs.nasa.gov/citations/19780000075
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