NASA NTRS · 19800000388
Integrated material-surface analyzer
Abstract
These 10 surface-analysis tests can be run without breaking vacuum: secondary-ion mass spectroscopy, ion-scattering spectroscopy, electron-stimulated desorption, residual-gas analysis, auger electron spectroscopy, x-ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy, characteristic-electron energy-loss spectroscopy, scanning electron microscope, scanning low-energy electron probe. Quadruple mass spectrometer, used in first 4 tests, serves as electron transfer lens in last 6 tests.
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Grunthaner, F. J., Lewis, B. F.. 1981-01-01. Integrated material-surface analyzer. https://ntrs.nasa.gov/citations/19800000388
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