NASA NTRS · 19820009380
Total-dose radiation effects data for semiconductor devices, volume 2
Abstract
Total ionizing dose radiation test data on integrated circuits are analyzed. Tests were performed with the electron accelerator (Dynamitron) that provides a steady state 2.5 MeV electron beam. Some radiation exposures were made with a Cobalt-60 gamma ray source. The results obtained with the Cobalt-60 source are considered an approximate measure of the radiation damage that would be incurred by an equivalent dose of electrons.
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Price, W. E., Martin, K. E., Nichols, D. K., Gauthier, M. K., Brown, S. F.. 1981-12-01. Total-dose radiation effects data for semiconductor devices, volume 2. https://ntrs.nasa.gov/citations/19820009380
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