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NASA NTRS · 19820033796

Microscopy and microstructure of Shuttle thermal protection system materials

Abstract

Examples of the contribution of microstructural analysis to the development of the Space Shuttle tile insulation system are presented, with photographic examples of the scanning electron microscope (SEM) investigations. After the basic thermal protection system materials had been selected, it was neccessary to analyze the mechanical responses of the combined materials; which included: (1) the polymer strain isolation pad (SIP), (2) the room temperature-vulcanizing silicone rubber bond, (RTV), and (3) rigid ceramic fiber reusable surface insulation (RSI). Microstructural analysis was used to provide information on deformation and fracture mechanisms, load transfer mechanisms, and structural alterations occurring before final failure. Both quantitative and qualitative information was obtained in the open, three-dimensional fibrous structures of the ceramic tiles by means of novel techniques of encapsulation and dissolution.

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BibTeXRIS

Newquist, C. W., Pfister, A. M., Miller, A. D., Scott, W. D.. 1981-11-01. Microscopy and microstructure of Shuttle thermal protection system materials. https://ntrs.nasa.gov/citations/19820033796

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