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Scott, W. D.

Publications and source records attributed to Scott, W. D..

11 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1986

Slow crack growth measurement using an electrical grid

Photolithography was used to produce a resistance grid on the surface of a DCB fracture specimen. The grid line spacings were 10 microns over a distance of 2 cm. Slow crack growth was measured on soda-lime-silica glass. At low values of K(I) (0.3 to 0.4 MPa.sq r + m, increased. Equations are given for the design of grids. The grid technique could be used to measure very slow crack growth at high temperature with appropriate compatible metal-ceramic materials.

Martin, D. J.↗
NASA NTRS1986

Surface mass transport of alumina

Measurements were made of the kinetics of thermal grooving at the intersection of rhombohedral twin boundaries with the (1 0 -1 0) plane in alumina, at temperatures from 1773 to 2273 K. An analysis of the values obtained on the basis of the model of Mullins (1957) indicated that surface diffusion was the dominant mass transport mechanism. Comparisons are made with the results of other investigations of alumina, and an equation is derived for the surface diffusion value.

Gaddipati, A. R.↗
NASA NTRS1983

Rhombohedral twinning in alumina

Alumina single crystals were deformed in compression along the c axes at temperatures of 625 to 1373 K. Large scale deformation by rhombohedral twinning was observed at a constant resolved shear stress of only 12.6 MPa between about 900 and 1373 K. Below 900 K, the twinning stress for specimens with ground surfaces rose rapidly to 227 MPa at 625 K. A model for twin growth in the absence of dislocation slip is proposed.

Scott, W. D.↗
NASA NTRS1981

Microscopy and microstructure of Shuttle thermal protection system materials

Examples of the contribution of microstructural analysis to the development of the Space Shuttle tile insulation system are presented, with photographic examples of the scanning electron microscope (SEM) investigations. After the basic thermal protection system materials had been selected, it was neccessary to analyze the mechanical responses of the combined materials; which included: (1) the polymer strain isolation pad (SIP), (2) the room temperature-vulcanizing silicone rubber bond, (RTV), and (3) rigid ceramic fiber reusable surface insulation (RSI). Microstructural analysis was used to provide information on deformation and fracture mechanisms, load transfer mechanisms, and structural alterations occurring before final failure. Both quantitative and qualitative information was obtained in the open, three-dimensional fibrous structures of the ceramic tiles by means of novel techniques of encapsulation and dissolution.

Newquist, C. W.↗
NASA NTRS1980

Design with brittle materials - An interdisciplinary educational program

A series of interdisciplinary design courses being offered to senior and graduate engineering students at the University of Washington is described. Attention is given to the concepts and some of the details on group design projects that have been undertaken during the past two years. It is noted that ceramic materials normally demonstrate a large scatter in strength properties. As a consequence, when designing with these materials, the conventional 'mil standards' design stresses with acceptable margins of safety cannot by employed and the designer is forced to accept a probable number of failures in structures of a given brittle material. It is this prediction of the probability of failure for structures of given, well-characterized materials that forms the basis for this series of courses.

Mueller, J. I.↗
NASA NTRS1975

Fundamental studies on the nature and properties of ceramic fiber insulation

Silica and mullite fibers used to fabricate reusable surface insulation (RSI) for the space shuttle orbiter may devitrify/recrystallize within the temperature range anticipated upon reentry. This is shown to be dependent upon impurity level, temperature, and time at temperature. It is determined that the effects of the material improvement and optimization program are positive. The degree of crystallinity is shown to have a predominant effect upon the strength of fabricated RSI tile, and limits are determined. Models are developed to predict tensile strengths and shrinkage rates of silica tile based upon readily measurable parameters. Thermal cycling which simulates reentry results in an increase in the crystallinity and in the porosity of tile coatings.

Mueller, J. I.↗
NASA NTRS1973

Effect of Cristobalite on the Mechanical Properties of Silica RSI Materials

The strength of various silica surface insulation materials was measured after high temperature heat treatment to develop substantial crystalline phases, and after low temperature thermal cycling through the alpha-beta cristobalite transformation. It appears that the presence of cristobalite in the structural elements (the fibers) is highly detrimental to tensile strength. When crystallization does not occur in silica material, the strength improves with heat treatment.

Khandelwal, P. K.↗
NASA NTRS1973

Measurement of dihedral angles by scanning electron microscopy.

The extension of Hoover's (1971) technique to the case of dihedral-angle measurement is described. Dihedral angles are often determined by interferometry on thermally grooved grain boundaries to obtain information on relative interfacial energies. In the technique considered the measured angles approach the true angles as the tilt angle approaches 90 deg. It is pointed out that the scanning electron microscopy method provides a means of seeing the real root of a groove at a lateral magnification which is higher than that obtainable with interferometry.

Achutaramayya, G.↗
NASA NTRS1971

Compressive creep of Al2O3 single crystals

Compressive creep of aluminum oxide single crystals deformed by dislocation glide and rhombohedral twinning, investigating activation energy and rate controlling mechanism

Bertolotti, R. L.↗
NASA NTRS1969

Impurity deposits on alumina crystals.

Silicate glass impurity droplet formations on alumina single crystals polished surfaces analyzed by electron microprobe as function of high temperature

Scott, W. D.↗