NASA NTRS · 19820036971
Methods and models for predicting fatigue crack growth under random loading
Abstract
Papers are presented in the volume summarizing the baseline data, methodology, procedures, and results of a round-robin analysis which was conducted to predict the fatigue crack growth in 2219-T851 aluminum center-cracked specimens subjected to flight loading in random cycle-by-cycle format. The objective of the analysis was to assess whether data from constant-amplitude fatigue crack growth tests on center-cracked specimens can be used to predict fatigue crack growth lives under random loading. The following approaches are discussed in detail: a root-mean-square approach, a crack-closure model, a multi-parameter yield zone model, and a load-interaction model.
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Chang, J. B., Hudson, C. M.. 1981-01-01. Methods and models for predicting fatigue crack growth under random loading. https://ntrs.nasa.gov/citations/19820036971
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