NASA NTRS · 19830000263
The Effect of Cosmic Rays on MSI Devices
Abstract
Low-power devices susceptible to cosmic-ray particles. Five MSI device technologies, including TTL, low power TTL, Schottky, CMOS, and low-power Schottky, subjected to 120-MeV krypton-ion beam from cyclotron and monitored for single-event upset. Results find terrestrial application for radiation hardening of electronic devices and systems.
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Nichols, D. K., Price, W. E., Woods, J. P.. 1984-04-01. The Effect of Cosmic Rays on MSI Devices. https://ntrs.nasa.gov/citations/19830000263
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