NASA NTRS · 19830000507
Radiation-Hardness Data For Semiconductor Devices
Abstract
Document presents data on and analysis of radiation hardness of various semiconductor devices. Data specifies total-dose radiation tolerance of devices. Volume 1 of report covers diodes, bipolar transistors, field effect transistors, silicon controlled rectifiers and optical devices. Volume 2 covers integrated circuits. Volume 3 provides detailed analysis of data in volumes 1 and 2.
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Price, W. E., Nichols, D. K., Brown, S. F., Gauthier, M. K., Martin, K. E.. 1984-11-01. Radiation-Hardness Data For Semiconductor Devices. https://ntrs.nasa.gov/citations/19830000507
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