NASA NTRS · 19850000297
Single-Event-Upset Studies: A Compilation
Abstract
Document summarizes 15 studies of single-event upsets covering 60 different types of semiconductor devices. Studies discussed in document include verification of basic reactions induced by heavy ions and protons and surveys of latchup and bit-flip susceptibility of several types of devices and device-fabrication technologies.
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Nichols, D. K., Price, W. E., Malone, C. J., Smith, L. S.. 1986-01-01. Single-Event-Upset Studies: A Compilation. https://ntrs.nasa.gov/citations/19850000297
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